The increase in demand for touch screen devices such as smartphones and tablets is evolving the importance of sheet resistance measurement. RS measures the electrical properties of materials e.g. conductivity and its strength. It is possible to measure the sheet resistance of ITO, conductive film, and wafer, which has recently been spotlighted as new material and offers various measurement methods like non-contact measurement according to the material.
Measurement range: 10^-4 ~ 10^7Ω(normal), 10^3 ~ 10^14Ω(high)
Measurement mode:contact / non-contact
Reproducibility: CV < 1.5%
Ω, Ω/□, Ω•cm, S/cm
> Non-contact measurement
> Low resistance measurement
> High resistance measurement
Conductive materials e.g. paint, ink, paste plastic, Si wafer, etc.
Conductive films e.g. ITO glass, evaporated metal, sprayed metal, ceramics, etc.
High resistance materials for LTPS fabrication e.g. a-Si, poly Si, etc.
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