Products > Film evaluation > Retardation > RE-200
RE-200 measures low retardation adopting an optical axis with high precision - 3σ ≦ 0.02°. Since the polarization intensity pattern is obtained in one shot, the polarizer rotation mechanism is not necessary and the system realizes not only the world's fastest measurement time but stable performance for extended use.
Possible to measure low(residual) retardation from 0nm
High-speed measurement of retardation simultaneously with optical axis detection(the world's fastest equivalent - to 0.1 seconds or less is possible)
High repeatability due to no drive unit
Less measurement items required to set and easier measurement method
Lineup includes various wavelengths in addition to 550nm
Rth measurement and omni-directional measurement possible(optional automatic rotation tilt jig is required)
*Combined with a tensile tester, photoelasticity can be evaluated simultaneously with the polarization characteristics of the film
| Sample size | 10 x 10mm ~ 100 x 100mm |
| Wavelength range | 550nm(standard) |
| Retardation measurement range | 0nm ~ 1μm |
| Axis detection repeatability | 0.05°(at 3σ) |
| Detector | polarization measurement module |
| Measurement spot diameter | 2.2 x 2.2mm |
| Light source | 100W halogen lamp or LED |
| Size and weight | 300(W) x 430(D) x 560(H)mm, approx. 20kg |
Retardation(ρ[deg.], re[nm])
Main axis azimuth(θ [deg.])
Ellipticity(ε) / azimuth angle(γ)
Three-dimensional refractive index(NxNyNz)
Measurable samples
Retardation film, polarizing film, elliptical film, viewing angle improvement film and other functional films
Transparent and anisotropic materials such as resin and glass(strain and distortion in glass)
Measured data
> Viewing angle improvement film A
> Viewing angle improvement film B
6F, 41, Seongnam-daero 925beon-gil, Bundang-gu, Seongnam-si, Gyeonggi-do, 13496, Republic of Korea
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