Otsuka Electronics, which has developed superior analysis devices using light, is holding a web seminar on optical thickness measurement. We look forward to your participation.
| TOPIC | [Webinar] Introduction to Analysis Principles and Application Fields of Non-contact Optical Thickness meter |
| FIELD | Film Thickness |
| RELATED MODELS | TFE series, OPTM series, SF-3 series, Line-scan thickness monitor, (Portable) Smart thickness measuring instrument |
| DATE | December 18, 2025 (Thursday) 15:00 ~ 16:00 (KST) |
| VENUE | Online |
| FEE | Free |
※Please note that this webinar will be held in Korean
[CONTENTS]
- Measurement and analysis principles of non-contact optical thickness meter
- nk modeling for Transparent/Semi-absorption Films
- Case studies and applications in the Semiconductor and Display industries
[RECOMMEND IF YOU]
- Professionals requiring in-depth study of the operating principles of optical thickness measurement instruments (SR, SE)
- Teams seeking precise thickness control for organic thin films utilized in OLED manufacturing.
- Engineers tasked with the critical thickness management of substrates, including Glass, SiC, and Si wafers.
- Experts engaged in ultra-precision micro-processes, such as Thin Film deposition, Deposition, and CMP, where advanced thin-film management is essential.
- Individuals in fields that demand accurate thickness control for roll-to-roll (R2R) Film processes and liquid samples.
- Clients who require a portable solution for thickness measurement, enabling unrestricted operation regardless of time or location.
[PROCEDURE]
15:00 ~ 15:40 (40min) Seminar
15:40 ~ 15:50 (10min) Questions and Answers
*The time is estimated and may be subject to change depending on the content of the lecture.
[NOTICE]
- Microsoft Teams
[APPLICATION METHOD]
- Registration Link : Microsoft Virtual Events Powered by Teams
We sincerely await your participation.
Otsuka Electronics, which has developed superior analysis devices using light, is holding a web seminar on optical thickness measurement. We look forward to your participation.
※Please note that this webinar will be held in Korean
[CONTENTS]
- Measurement and analysis principles of non-contact optical thickness meter
- nk modeling for Transparent/Semi-absorption Films
- Case studies and applications in the Semiconductor and Display industries
[RECOMMEND IF YOU]
- Professionals requiring in-depth study of the operating principles of optical thickness measurement instruments (SR, SE)
- Teams seeking precise thickness control for organic thin films utilized in OLED manufacturing.
- Engineers tasked with the critical thickness management of substrates, including Glass, SiC, and Si wafers.
- Experts engaged in ultra-precision micro-processes, such as Thin Film deposition, Deposition, and CMP, where advanced thin-film management is essential.
- Individuals in fields that demand accurate thickness control for roll-to-roll (R2R) Film processes and liquid samples.
- Clients who require a portable solution for thickness measurement, enabling unrestricted operation regardless of time or location.
[PROCEDURE]
15:00 ~ 15:40 (40min) Seminar
15:40 ~ 15:50 (10min) Questions and Answers
*The time is estimated and may be subject to change depending on the content of the lecture.
[NOTICE]
- Microsoft Teams
[APPLICATION METHOD]
- Registration Link : Microsoft Virtual Events Powered by Teams
We sincerely await your participation.