[Webinar] Spectroscopic Reflectometer: analysis principle & application field - 2026.12.17 : Events in detail

Otsuka Electronics, which has developed superior analysis devices using light, is holding a web seminar on optical thickness measurement. We look forward to your participation.

TOPIC	[Webinar] Spectroscopic Reflectometer: analysis principle & application field
FIELD	Thin Film
RELATED MODELS	OPTM series, TFE series, SF-3 Series, Line Scanner, (portable) Smart thickness
DATE	December 17 (Thu ), 2026 \| 3:00 PM – 4:00 PM KST
VENUE	Online
FEE	Free

※Please note that this webinar will be held in Korean

[CONTENTS]

- Principles of Measurement and Analysis of Non-contact Optical Thickness Measuring Instruments
- NK modeling of transparent/semi-absorbent film
- Semiconductor/Display Analysis Cases and Applications

[RECOMMEND IF YOU.. ]
- Principles of Optical Thickness Measuring Instrument If you need a Study (SR, SE)
- Who needs to manage the thickness of organic thin films for OLED
- Who needs to manage the thickness of glass substrate, SiC, Si substrate
- For those who need thin film management in ultra-precise fine processes such as thin film, deposition, and CMP
- Film(R2R), those who are engaged in areas that require thickness management of liquid samples
- If you need to measure the thickness in a portable form without any time and place restrictions

[PROCEDURE]

- 15:00 ~ 15:40 (40min) Seminar

- 15:40 ~ 16:00 (20min) Questions and Answers

[HOW TO PROCEED]

- Microsoft Teams

We sincerely await your participation.