(Closed) [Webinar] Spectroscopic Reflectometer: analysis principle & application field - 2024.12.12 : Events in detail

Seminar(Closed) [Webinar] Spectroscopic Reflectometer: analysis principle & application field - 2024.12.12

Otsuka Electronics, which has developed superior analysis devices using light, is holding a web seminar on optical thickness measurement. We look forward to your participation.

TOPIC	[Webinar] Spectroscopic Reflectometer: analysis principle & application field
FIELD	Semiconductor/Display
RELATED MODELS	OPTM series, FE series, SF-3 series, Line Scanner
DATE	DEC 12(THU), 2024 PM 3:00
VENUE	Online
FEE	Free

※Please note that this webinar will be held in Korean

[CONTENTS]

- Measurement and analysis principle of optical thickness measurement

- Analysis cases and applications in the semiconductor/display field

[RECOMMEND IF YOU]

- want to know the measurement Principles of Optical Thickness Measuring Instruments

- Are looking for an Equipment capable of thickness management before and after wafer polishing

- Are manufacturing on Film(R2R), separator and liquid material

- If you need to measure the thickness regardless of time and place in a portable for

[PROCEDURE]

15:00 ~ 15:40 (40min) Seminar

15:40 ~ 15:50 (10min) Questions and Answers