LE series are inline evaluation system for optical characteristics of LED synchronized with control signal in production line.
LE-5400 provides optical characteristics data which are required for quality control such as OK / NG judgement and LED binning.
#micro LED, OLED, lighting, LED, kuv, kred, LIDAR, VCSELS
Synchronized with control signal in production line
Flexible and various measurement systems with optical fiber
High speed test – short exposure time(min. 2msec. / LE-5400)
High speed measuring cycle – test / calculation / evaluation(half a time compared with previous model)
|Spectrum range(nm)||380 ~ 960||300 ~ 800||330 ~ 1,100||350 ~ 930|
|*Wavelength accuracy(nm)||± 0.3||± 0.3||± 0.5||± 0.3|
|Grating||brazed holographic type|
|Detector||electro-cooling CCD image sensor|
|**Optical fiber||length: about 2m, diameter: about 12mm|
|Consumption electricity||max. 100VA|
|Size and weight||280(W) x 160(H) x 296(D)mm, approx. 10kg|
*confirmed on the emission line of wavelength calibration light source, complying with JIS Z 8724
**shapes and lengths can be adjustable
*Tristimulus value 〔JIS Z 8724〕
Chromaticity(u, v) 〔CIE 1960UCS〕
Chromaticity(x, y) 〔JIS Z 8724〕
Chromaticity(u', v') 〔CIE 1976UCS〕
Dominant wavelength and Excitation purity 〔JIS Z 8701〕
Correlated color temperature and Duv 〔JIS Z 8725〕
Color rendering index(Ra, R1 ~ R15) 〔JIS Z 8726〕
Wavelength, height and half band width of the peak
Wavelength, height of the second peak
Height of designated wavelength
Integrated value of shorter/longer wavelength of the peak
*brightness (kY) can be vary depends on the detector and optical system of measuring LED.
It is valid only when reproducibility of alignment(distance, position and direction) is confirmed.