LE series

LE series


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LE series High speed LED spectrometer

LE series are inline evaluation system for optical characteristics of LED synchronized with control signal in production line.


LE-5400 provides optical characteristics data which are required for quality control such as OK / NG judgement and LED binning.


#micro LED, OLED, lighting, LED, kuv, kred, LIDAR, VCSELS

 Features  
  • Synchronized with control signal in production line

  • Flexible and various measurement systems with optical fiber

  • High speed test – short exposure time(min. 2msec. / LE-5400)

  • High speed measuring cycle – test / calculation / evaluation(half a time compared with previous model)

 Specifications 
TypeABCD
Spectrum range(nm)380 ~ 960300 ~ 800330 ~ 1,100350 ~ 930
*Wavelength accuracy(nm)± 0.3
± 0.3
± 0.5
± 0.3
Methodspectral method
SpectrometerF=3, f=135mm
Gratingbrazed holographic type
Detectorelectro-cooling CCD image sensor
**Optical fiberlength: about 2m, diameter: about 12mm
Consumption electricitymax. 100VA
Size and weight280(W) x 160(H) x 296(D)mm, approx. 10kg

*confirmed on the emission line of wavelength calibration light source, complying with JIS Z 8724

**shapes and lengths can be adjustable

 Measurement  

Measurement items

  • *Tristimulus value 〔JIS Z 8724〕

  • Chromaticity(u, v) 〔CIE 1960UCS〕

  • Chromaticity(x, y) 〔JIS Z 8724〕

  • Chromaticity(u', v') 〔CIE 1976UCS〕

  • Dominant wavelength and Excitation purity 〔JIS Z 8701〕

  • Correlated color temperature and Duv 〔JIS Z 8725〕

  • Color rendering index(Ra, R1 ~ R15) 〔JIS Z 8726〕

  • Wavelength, height and half band width of the peak 

  • Wavelength, height of the second peak 

  • Integrated value 

  • Center-of-gravity wavelength 

  • Height of designated wavelength 

  • Integrated value of shorter/longer wavelength of the peak

    *brightness (kY) can be vary depends on the detector and optical system of measuring LED.
    It is valid only when reproducibility of alignment(distance, position and direction) is confirmed.