Retardation film and material evaluation system

Retardation film and material evaluation system

Products > Display evaluation > Color filter(LCD) > RETS 100

Products > Film evaluation > Retardation > RETS 100

RETS 100

RETS100 provides accurate and various determination results of optical film polarization characteristics. e.g. wavelength dispersion of retardation, orientation angle, optical axis, and etc. Employing non-destructive and non-contact testing, the properties of any kind of single or multi-layered films are accurately checked in safety, in full optimization with customer application.

 Features  (*option)
  • Accurate retardation measurement at designated wavelength with MCPD as a detector

  • *Evaluation of viewing-angle characteristics including Rth parameter analysis with tilt/rotation stage

  • Fixable sample stage for each sample size

  • Precise measurement of micro retardation(0.1nm or more)

  • Measures retardation and axis of each layer for multi-layered sample with non-destructive testing

Measurement images by film types

Rotation measuring rangerotating analyzer method: approx. 0nm ~ tens of μm
light interference method: approx. 450nm ~ several μm
Retardation repeatability*3σ ≤ 0.08nm
Sample stageX-Y stagesample size: min. 20 x 20mm / max. 100 x 100mm
thickness: 2.5mm or less
tilt/rotation stagesample size: min. 25 x 25mm / max. 100 x 100mm
tilt angle: ± 50° / rotation angle: ± 180°
Detectorarray spectrometer: 512ch photodiode array
wavelength range: 400nm ~ 800nm
accuracy: ± 0.5nm
Polarizing optionmeasurement
spot diameter
φ 1mm, φ 2mm, φ 5mm, φ 10mm(aperture switch)
polarizing unit for
collimating optics

Glan-Thompson prism extinction ratio 10^-5

automatic rotation(angle accuracy 0.1°)

automatic loading/unloading

2 units for polarizer and analyzer


receiving fiber(quartz) / emitting fiber(quartz)

Light source100W halogen lamp
Data processorPC, monitor
Size and weight540(W) × 580(D) × 1000(H)mm, approx. 60kg
Power supplyAC 100V ± 10V, 1.5kVA

*quartz crystal wavelength plate(approx. 600nm, 2 plates at λ 550nm) 

Measurement items (*option)
  • Retardation

  • Wavelength dispersion of retardation

  • Sample tilting angle

  • Azimuth, ellipticity

  • Polarization measurement

  • Spectroscopic measurement

  • Chromaticity measurement

  • Nx, Ny, Nz, Rth

  • *Haze

  • *Optical elasticity

  • Optical film, retardation film, ellipsoidal film, retardation plate, polarizing film, function added polarizing film, polarizing plate

  • Polarizing measurement of LC material and LC cell, optical parts for polarizing light(TN, STN, IPS, VA, OCB)

6F, 41, Seongnam-daero 925beon-gil, Bundang-gu, Seongnam-si, Gyeonggi-do, 13496, Republic of Korea

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