Products > Display evaluation > Color filter(LCD) > RETS 100
Products > Film evaluation > Retardation > RETS 100
RETS100 provides accurate and various determination results of optical film polarization characteristics. e.g. wavelength dispersion of retardation, orientation angle, optical axis, and etc. Employing non-destructive and non-contact testing, the properties of any kind of single or multi-layered films are accurately checked in safety, in full optimization with customer application.
Accurate retardation measurement at designated wavelength with MCPD as a detector
*Evaluation of viewing-angle characteristics including Rth parameter analysis with tilt/rotation stage
Fixable sample stage for each sample size
Precise measurement of micro retardation(0.1nm or more)
Measures retardation and axis of each layer for multi-layered sample with non-destructive testing
| Rotation measuring range | rotating analyzer method: approx. 0nm ~ tens of μm light interference method: approx. 450nm ~ several μm | |
| Retardation repeatability | *3σ ≤ 0.08nm | |
| Sample stage | X-Y stage | sample size: min. 20 x 20mm / max. 100 x 100mm thickness: 2.5mm or less |
| tilt/rotation stage | sample size: min. 25 x 25mm / max. 100 x 100mm tilt angle: ± 50° / rotation angle: ± 180° | |
| Detector | array spectrometer: 512ch photodiode array wavelength range: 400nm ~ 800nm accuracy: ± 0.5nm | |
| Polarizing option | measurement spot diameter | φ 1mm, φ 2mm, φ 5mm, φ 10mm(aperture switch) |
| polarizing unit for transmission | collimating optics Glan-Thompson prism extinction ratio 10^-5 automatic rotation(angle accuracy 0.1°) automatic loading/unloading 2 units for polarizer and analyzer | |
| Fiber | receiving fiber(quartz) / emitting fiber(quartz) | |
| Light source | 100W halogen lamp | |
| Data processor | PC, monitor | |
| Size and weight | 540(W) × 580(D) × 1000(H)mm, approx. 60kg | |
| Power supply | AC 100V ± 10V, 1.5kVA | |
*quartz crystal wavelength plate(approx. 600nm, 2 plates at λ 550nm)
Retardation
Wavelength dispersion of retardation
Sample tilting angle
Azimuth, ellipticity
Polarization measurement
Spectroscopic measurement
Chromaticity measurement
Nx, Ny, Nz, Rth
*Haze
*Optical elasticity
Optical film, retardation film, ellipsoidal film, retardation plate, polarizing film, function added polarizing film, polarizing plate
Polarizing measurement of LC material and LC cell, optical parts for polarizing light(TN, STN, IPS, VA, OCB)
6F, 41, Seongnam-daero 925beon-gil, Bundang-gu, Seongnam-si, Gyeonggi-do, 13496, Republic of Korea
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