AL-1000 measures the brightness of micro LED on chip and wafer using high sensitivity spectrometer.
It is possible to adjust the measurement area and to measure from ultra low brightness(from 1μcd).
#micro LED, luminous flux, lm
Ideal for precise measurement of ultra-low light at 1μcd level by applying ultra-high sensitivity spectroradiometer
Traceable with KOLAS, JCSS and NIST
Works with SMU(Source Meter Unit)
|Luminance(cd)||± 4%(1μcd ~ 1mcd) / ± 2%(1mcd ~)|
|Dominant wavelength(wd)||± 0.5nm|
|Measurement wavelength(wd)||300 ~ 950nm / 360 ~ 1,100nm|
|Measuring area||max. 100 x 100mm|
|Contact size||over 3μm|
Measured data (*option)
Luminance, color coordinates, color rendering, color temperature, spectrum analysis
Forward voltage(VF, V), forward current(IF, A)
*Goniometer(light distribution, total luminous flux)
Chip, wafer, module quality control