Luminous intensity measurement system

Luminous intensity measurement system

Products > Light measurement > Micro LED measurement system > AL-1000

AL-1000

AL-1000 is designed for the brightness measurement of micro LED on chip and wafer. With its high sensitivity spectrometer, it measures ultra low brightness from 1μcd. It is ideal for the delicate application field from quality control to research and development.

 Features  
  • Ideal for precise measurement of ultra-low light at 1μcd level by applying ultra-high sensitivity spectroradiometer

  • Traceable with KOLAS, JCSS and NIST

  • Works with SMU(Source Meter Unit)

 Specifications 
Luminance(cd)± 4%(1μcd ~ 1mcd) / ± 2%(1mcd ~)
Dominant wavelength(wd)± 0.5nm
Measurement wavelength(wd)300 ~ 950nm / 360 ~ 1,100nm
Chromaticity(x,y)± 0.002
Measuring areamax. 100 x 100mm
Contact sizeover 3μm


 Measurement  

Measured data (*option)

  • Luminance, color coordinates, color rendering, color temperature, spectrum analysis

  • Forward voltage(VF, V), forward current(IF, A)

  • *Goniometer(light distribution, total luminous flux)

 Applications  
  • Chip, wafer, module quality control

  • R&D