Products > Light measurement > Micro LED measurement system > AL-1000
AL-1000 is designed for the brightness measurement of micro and mini LED on chip and wafer. With its high sensitivity spectrometer, it measures ultra low brightness from 1μcd. It is ideal for the delicate application field from quality control to research and development.
Ideal for precise measurement of ultra-low light at 1μcd level by applying ultra-high sensitivity spectroradiometer
Traceable with KOLAS, JCSS and NIST
Able to adjust the measurement area
Able to link with SMU(Source Meter Unit)
| Luminous intensity(cd) | ± 4%(1μcd ~ 1mcd) / ± 2%(1mcd ~) |
| Dominant wavelength(wd) | ± 0.5nm |
| Measurement wavelength | 360 ~ 830nm / 360 ~ 1,100nm |
| Chromaticity(x,y) | ± 0.002 |
| Measuring area | max. 100 x 100mm |
| Contact size | over 3μm |
| Minimum Luminous intensity | 1μcd |
Measured data (*option)
Luminous intensity, color coordinates, color rendering, color temperature, spectrum analysis
Forward voltage(VF, V), forward current(IF, A)
*Goniometer(light distribution, total luminous flux)
Chip, wafer, module quality control
micro LED, mini LED
R&D
6F, 41, Seongnam-daero 925beon-gil, Bundang-gu, Seongnam-si, Gyeonggi-do, 13496, Republic of Korea
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